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Microelectromechanical systems
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471	Microsoft Word - 037_Qian Add to Reading List Source URL: www.nafems.de Language: English - Date: 2014-08-29 05:40:00 Microtechnology Hysteresis Magnetic ordering Systems theory Electromagnetism Ansys Microbeam Microelectromechanical systems Science Physics Materials science Radiobiology
472	Electronics & Instrumentation: Devices and Systems 6MeV Medical Linear Accelerator-JV1 Add to Reading List Source URL: www.csir.res.in Language: English - Date: 2014-12-04 02:22:20 Electromagnetism Physics Microtechnology Measuring instruments Klystron Microelectromechanical systems Pressure sensor Technology Sensors Transducers
473	Schedule of Events Tuesday, October 5th, 2010 (evening) In collaboration with CMC Microsystems Brookstreet Hotel, Kanata 6:00 p.m. Add to Reading List Source URL: itac.ca Language: English - Date: 2014-12-19 06:05:51 Microelectromechanical systems Transducers Microsystem Technology Engineering Physics Microtechnology Electrical engineering Mechanical engineering
474	F R A U N H O F E R I N S T I T U Te f o r M i c r o e l e c t r o n i c c ir c ui t s a n d S y s t ems I M S Fraunhofer IMS Add to Reading List Source URL: www.ims.fraunhofer.de Language: English - Date: 2014-07-15 03:49:48 Optics Transducers Optical devices Semiconductor device fabrication Sensors Active pixel sensor Microelectromechanical systems CMOS Photodiode Technology Electromagnetism Image sensors
475	F R A U N H O F E R I n s t i t u t e for E l e c t roni c N ano S y s t e m s E N A S Back-End of line 1 Add to Reading List Source URL: www.enas.fraunhofer.de Language: English - Date: 2015-01-15 07:05:47 Thin film deposition Emerging technologies Semiconductor device fabrication Microtechnology Microelectromechanical systems Atomic layer deposition Carbon nanotube Chemical vapor deposition Thin film Technology Materials science Chemistry
476	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-19 10:55:49 Electromagnetism Electrical engineering Mechanical engineering Microelectromechanical systems Transducers Microsystem Technologies Wafer bonding Shuvo Roy RF MEMS Materials science Microtechnology Technology
477	ATOMIC LAYER DEPOSITION AND TARGETED APPLICATION AREAS 1 Add to Reading List Source URL: www.enas.fraunhofer.de Language: English - Date: 2015-01-15 11:33:29 Emerging technologies Atomic layer deposition Thin film deposition Carbon nanotube Microelectromechanical systems Copper Giant magnetoresistance Chemistry Materials science Physics
478	F R A U N H O F E R I N S T I T U T E F O R M E C H A N I C S O F M AT E R I A L S I W M COMPONENTS IN MICROELECTRONICS AND MICROSYSTEMS TECHNOLOGY Your competent partner for Add to Reading List Source URL: www.en.iwm.fraunhofer.de Language: English - Date: 2011-11-18 03:55:18 Technology Electron microscopy Failure Thin film deposition Microtechnology Microelectromechanical systems Failure analysis Wafer bonding Focused ion beam Science Semiconductor device fabrication Scientific method
479	3D INTEGRATION: TSV PROCESSES AND WAFER THINNING 1 Add to Reading List Source URL: www.enas.fraunhofer.de Language: English - Date: 2015-01-15 16:05:10 Technology Deep reactive-ion etching Microelectromechanical systems Etching Wafer Applied Materials Thermal oxidation Back end of line Photoresist Semiconductor device fabrication Materials science Microtechnology
480 $Failure / Materials science / Electron microscopy / Maintenance / Semiconductor device fabrication / Failure analysis / Electron microscope / Electron backscatter diffraction / Microelectromechanical systems / Science / Scientific method / Physics$	CONTACT Prof. Dr. Matthias Petzold Fraunhofer CAM Heideallee 19 (office) \| Walter-Hülse-Str. 1 (mail[removed]Halle (Saale) \| Germany Phone: +[removed] Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:30:28 Failure Materials science Electron microscopy Maintenance Semiconductor device fabrication Failure analysis Electron microscope Electron backscatter diffraction Microelectromechanical systems Science Scientific method Physics

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